<--- Back to Details
First PageDocument Content
Microscopes / Physics / Electron microscope / High-resolution transmission electron microscopy / Transmission electron microscopy / Scanning transmission electron microscopy / Ondrej Krivanek / Scanning electron microscope / Contrast transfer function / Scientific method / Electron microscopy / Science
Date: 1970-04-13 05:20:51
Microscopes
Physics
Electron microscope
High-resolution transmission electron microscopy
Transmission electron microscopy
Scanning transmission electron microscopy
Ondrej Krivanek
Scanning electron microscope
Contrast transfer function
Scientific method
Electron microscopy
Science

WORKSHOP REPORT ABERRATION CORRECTION IN ELECTRON MICROSCOPY MATERIALS RESEARCH IN AN ABERRATION-FREE ENVIRONMENT

Add to Reading List

Source URL: ncem.lbl.gov

Download Document from Source Website

File Size: 890,71 KB

Share Document on Facebook

Similar Documents

Microsoft PowerPoint - Soo hyoun Adv Mater Cover pieces.ppt [Compatibility Mode]

Microsoft PowerPoint - Soo hyoun Adv Mater Cover pieces.ppt [Compatibility Mode]

DocID: 199aW - View Document

Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA  (www.nion.com)

Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com)

DocID: yvVK - View Document

WORKSHOP REPORT  ABERRATION CORRECTION IN ELECTRON MICROSCOPY MATERIALS RESEARCH IN AN ABERRATION-FREE ENVIRONMENT

WORKSHOP REPORT ABERRATION CORRECTION IN ELECTRON MICROSCOPY MATERIALS RESEARCH IN AN ABERRATION-FREE ENVIRONMENT

DocID: 6ss3 - View Document