Back to Results
First PageMeta Content
Physics / Microscopes / Electron beam / Electron energy loss spectroscopy / Spectroscopy / Electron microscope / Scanning transmission electron microscopy / Electron / Transmission electron microscopy / Scientific method / Electron microscopy / Science


Aberration-corrected scanning transmission electron microscopy: Probing individual atoms Ondrej L. Krivanek Nion Co., Kirkland, WA, USA (www.nion.com)
Add to Reading List

Document Date: 2011-05-19 17:42:40

Open Document

File Size: 170,19 KB

Share Result on Facebook

Company

Ondrej L. Krivanek Nion Co. / /

Country

Germany / /

Facility

Arizona State University / /

IndustryTerm

energy resolution / structural and chemical analysis / chemical type / fractional energy resolution / keV electron energy / imaging / chemical identity / energy / meV energy resolution / /

Organization

Arizona State University / /

Technology

radiation / spectroscopy / simulation / /

URL

www.nion.com / /

SocialTag