![Microscopes / Physics / Electron microscope / High-resolution transmission electron microscopy / Transmission electron microscopy / Scanning transmission electron microscopy / Ondrej Krivanek / Scanning electron microscope / Contrast transfer function / Scientific method / Electron microscopy / Science Microscopes / Physics / Electron microscope / High-resolution transmission electron microscopy / Transmission electron microscopy / Scanning transmission electron microscopy / Ondrej Krivanek / Scanning electron microscope / Contrast transfer function / Scientific method / Electron microscopy / Science](https://www.pdfsearch.io/img/121969997bceba6602457fc751e81330.jpg) Date: 1970-04-13 05:20:51Microscopes Physics Electron microscope High-resolution transmission electron microscopy Transmission electron microscopy Scanning transmission electron microscopy Ondrej Krivanek Scanning electron microscope Contrast transfer function Scientific method Electron microscopy Science | | WORKSHOP REPORT ABERRATION CORRECTION IN ELECTRON MICROSCOPY MATERIALS RESEARCH IN AN ABERRATION-FREE ENVIRONMENTAdd to Reading ListSource URL: ncem.lbl.govDownload Document from Source Website File Size: 890,71 KBShare Document on Facebook
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