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Date: 2012-02-07 15:25:31 IEEE Electron Devices Society Engineering Institute of Electrical and Electronics Engineers Siegfried Selberherr Stephen A. Parke Symposium on VLSI Circuits Charge trap flash Semiconductors Electronic engineering International Electron Devices Meeting		Microsoft Word - HTC Workshops.doc Add to Reading List Source URL: eds.ieee.org Download Document from Source Website File Size: 1,26 MB Share Document on Facebook

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