<--- Back to Details
First PageDocument Content
Electronics manufacturing / Wafer bonding / Microelectromechanical systems / Anodic bonding / Eutectic bonding / Wafer / Adhesive bonding / Glass frit bonding / Direct bonding / Microtechnology / Technology / Electronics
Date: 2015-01-15 05:44:20
Electronics manufacturing
Wafer bonding
Microelectromechanical systems
Anodic bonding
Eutectic bonding
Wafer
Adhesive bonding
Glass frit bonding
Direct bonding
Microtechnology
Technology
Electronics

SEMI-FINISHED BONDED SUBSTRATES Silicon LiTaO3 100 µm

Add to Reading List

Source URL: www.enas.fraunhofer.de

Download Document from Source Website

File Size: 1,15 MB

Share Document on Facebook

Similar Documents

Wafer-level Processes INSPECTION Checking for waferto-wafer bonding integrity Detection of internal

DocID: 1shtL - View Document

Wafer-level Processes INSPECTION Checking for waferto-wafer bonding integrity Detection of internal

DocID: 1rNMV - View Document

1 銅錫晶圓接合 CU/SN WAFER BONDING 范承翰

DocID: 1pUao - View Document

Electronics manufacturing / Packaging / Microtechnology / Semiconductor device fabrication / Wafer bonding / SUSS MicroTec / Wafer / Microelectromechanical systems / Acoustic microscopy / Silicon on insulator / Eutectic bonding / Capacitive micromachined ultrasonic transducers

Imaging Bonded Wafer Defects for 3-D A practical, acoustic imaging technique is applied to bonded wafer pairs to image interface defects and wafer scratches in various materials. he range of products whose fabrication

DocID: 1oWR7 - View Document

EV Group Joins IRT Nanoelec 3D Integration Program ST. FLORIAN, Austria – Feb. 5, 2016 – EV Group (EVG), an industry-leading supplier of wafer-bonding, lithography/nanoimprint lithography (NIL), metrology, photoresis

DocID: 1nVjd - View Document