Oxide thin film transistor

Results: 11



#Item
1Research Article www.acsami.org Water-Soluble Thin Film Transistors and Circuits Based on Amorphous Indium−Gallium−Zinc Oxide Sung Hun Jin,*,†,¶ Seung-Kyun Kang,⊥,¶ In-Tak Cho,§,¶ Sang Youn Han,⊥,# Ha Uk Ch

Research Article www.acsami.org Water-Soluble Thin Film Transistors and Circuits Based on Amorphous Indium−Gallium−Zinc Oxide Sung Hun Jin,*,†,¶ Seung-Kyun Kang,⊥,¶ In-Tak Cho,§,¶ Sang Youn Han,⊥,# Ha Uk Ch

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Source URL: rogers.matse.illinois.edu

Language: English - Date: 2015-05-04 07:20:04
2MAIN DISPLAY  Mobile Display Driver IC Solomon Systech offers a series of single-chip TFT LCD Driver ICs to support TFT display panels of a wide range of resolutions from QVGA to QHD, which are ideal for smartphone appli

MAIN DISPLAY Mobile Display Driver IC Solomon Systech offers a series of single-chip TFT LCD Driver ICs to support TFT display panels of a wide range of resolutions from QVGA to QHD, which are ideal for smartphone appli

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Source URL: www.solomon-systech.com.cn

Language: English - Date: 2016-05-04 23:06:31
3KAUST Repository High Electron Mobility Thin-Film Transistors Based on Solution-Processed Semiconducting Metal Oxide Heterojunctions and Quasi-Superlattices

KAUST Repository High Electron Mobility Thin-Film Transistors Based on Solution-Processed Semiconducting Metal Oxide Heterojunctions and Quasi-Superlattices

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Source URL: repository.kaust.edu.sa

Language: English - Date: 2015-05-31 04:48:59
4T ECH HIGHLIGH T S Chloride Ion Interaction with Oxide-Covered Aluminum Leading to Pitting Corrosion Corrosion would be a much more common phenomenon were it not for the passive

T ECH HIGHLIGH T S Chloride Ion Interaction with Oxide-Covered Aluminum Leading to Pitting Corrosion Corrosion would be a much more common phenomenon were it not for the passive

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Source URL: www.electrochem.org

Language: English - Date: 2015-01-05 15:18:14
5AMDp2 - 5  High-Performance and Low-Temperature-Compatible Solid Phase Crystallized Polycrystalline Silicon Thin Film Transistors Using Thermal Oxide Buffered Aluminum Oxide as Gate Dielectric

AMDp2 - 5 High-Performance and Low-Temperature-Compatible Solid Phase Crystallized Polycrystalline Silicon Thin Film Transistors Using Thermal Oxide Buffered Aluminum Oxide as Gate Dielectric

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 03:11:48
6IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 59, NO. 2, FEBRUARY[removed]Zinc-Oxide Thin-Film Transistor With Self-Aligned Source/Drain Regions Doped With Implanted

IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 59, NO. 2, FEBRUARY[removed]Zinc-Oxide Thin-Film Transistor With Self-Aligned Source/Drain Regions Doped With Implanted

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 02:44:38
7P-22: Top-Gate Thin Film Transistor with ZnO:N Channel Fabricated by Room Temperature RF Magnetron Sputtering

P-22: Top-Gate Thin Film Transistor with ZnO:N Channel Fabricated by Room Temperature RF Magnetron Sputtering

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 03:11:50
8IEEE ELECTRON DEVICE LETTERS, VOL. 35, NO. 8, AUGUST[removed]A Comparative Study on the Effects of Annealing on the Characteristics of Zinc Oxide Thin-Film

IEEE ELECTRON DEVICE LETTERS, VOL. 35, NO. 8, AUGUST[removed]A Comparative Study on the Effects of Annealing on the Characteristics of Zinc Oxide Thin-Film

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 02:44:38
9TF.1  Evaluation of Self-Heating and Hot Carrier Degradation of Poly-Si Thin-Film Transistors Using Charge Pumping Technique

TF.1 Evaluation of Self-Heating and Hot Carrier Degradation of Poly-Si Thin-Film Transistors Using Charge Pumping Technique

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-10 02:44:39
10Thin Solid Films[removed]–400  Contents lists available at ScienceDirect Thin Solid Films journal homepage: www.elsevier.com/locate/tsf

Thin Solid Films[removed]–400 Contents lists available at ScienceDirect Thin Solid Films journal homepage: www.elsevier.com/locate/tsf

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Source URL: www.pskl.ust.hk

Language: English - Date: 2014-10-09 23:15:50